International Workshop on Modeling Post-Harvest Quality of High Value Crops in East Africa

Introduction

The economic success of fruit and vegetable production is highly dependent on quality preservation in the post-harvest phase. Understanding the processes affecting fruit and vegetable quality during storage is essential to predict produce quality. Good prediction models based on scientific knowledge help to make optimal decisions regarding sales, storage and transport.

Therefore a workshop on modeling post-harvest quality of high value crops in East Africa from Saturday 15th May 2010 to Saturday 22nd May 2010 has been organized. The workshop will create an understanding of the use of simulation modeling to predict the behavior of highly perishable fruits and vegetables.

Venue

African Institute for Capacity Development (AICAD)

Organizers

The workshop is organized by Jomo Kenyatta University of Agriculture and Technology (JKUAT) in collaboration with the University of Hannover, Germany.

Participants

25 participants drawn from various countries in Asia, Africa and Europe will take part. Two IT students from JKUAT will also take part.

Sponsor

The workshop is sponsored by the German Academic Exchange Service (DAAD) under its Alumni programme

Presentation mode

The 7 days intensive workshop will be conducted through:
1) Lectures on post-harvest physiology and post-harvest handling
2) Lectures on modeling techniques and their use to describe plant physiological and plant pathological processes in the post-harvest phase
3) Exercises in modeling
4) Excursions to fruit and vegetable producers and processors
5) Cases studies of post-harvest problems
6) Group discussions on problems, approaches and solutions in post-harvest handling

Contacts

Dr. John M. Wesonga, Department of Horticulture, Jomo Kenyatta University of Agriculture and Technology (JKUAT). Email: jwesonga@agr.jkuat.ac.ke

Prof. Hartmut Stuetzel, Institute of Biological Production Systems, University of Hannover.
Email: stuetzel@gem.uni-hannover.de

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